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Bruker Nano GmbH

Booth number: 624

www.bruker.com
productinfo.emea@bruker.com

About us

Bruker Nano offers solutions for all your nanoscience needs.
Bruker Nano Analytics develops, manufactures and markets systems for the investigation of the composition and structure of materials on the micro and nano scale. This includes EDS, EBSD, WDS and Micro-XRF for scanning electron microscopes.

The M-series for micro X-ray fluorescence spectrometry as well as handheld X-ray fluorescence (XRF) analyzers enable non-destructive element analysis. Our total reflection X-ray fluorescence (TXRF) spectrometers add to our range of nano analysis solutions.

Bruker Nano Surfaces offers 3D metrology and inspection systems including atomic force microscopes, optical/stylus profilers and mechanical and tribological tools with unmatched capabilities.



Products and services

Bruker Nano Analytic’s electron microscope analyzers QUANTAX EDS, QUANTAX WDS, QUANTAX EBSD and QUANTAX Micro-XRF on SEM provide unmatched comprehensive compositional and structural materials analysis.

The M-series for micro X-ray fluorescence spectrometry (Micro-XRF) as well as the handheld X-ray fluorescence (XRF) analyzers S1 TITAN and TRACER 5i enable non-destructive element analysis. Our total reflection X-ray fluorescence (TXRF) spectrometers add to our range of nano analysis solutions.

Bruker Nano Surfaces offers 3D metrology and inspection systems including atomic force microscopes, optical/stylus profilers and mechanical and tribological tools with unmatched capabilities.

Electron Microscope and Micro-XRF Analyzers

Electron Microscope and Micro-XRF Analyzers

Bruker Nano offers solutions for all your nanoscience needs.
Bruker Nano Analytic’s electron microscope analyzers QUANTAX EDS, QUANTAX WDS, QUANTAX EBSD and QUANTAX Micro-XRF on SEM provide unmatched comprehensive compositional and structural materials analysis. The M-series for micro X-ray fluorescence spectrometry (Micro-XRF) enables non-destructive element analysis. Our total reflection X- ray fluorescence (TXRF) spectrometers add to our range of nano analysis solutions.

www.bruker.com/nano-analytics

Dimension FastScan AFM

Dimension FastScan AFM

Bruker Nano offers solutions for all your nanoscience needs.
Bruker Nano Surfaces offers 3D metrology and inspection systems including atomic force microscopes, optical/stylus profilers and mechanical and tribological tools with unmatched capabilities.

www.bruker.com/products/surface-and-dimensional-anal...

S1 TITAN Handheld XRF Spectrometer

S1 TITAN Handheld XRF Spectrometer

Bruker’s handheld X-ray fluorescence (XRF) analyzers enable non-destructive element analysis.
S1 TITAN industrial analyzers are intended for specific applications such as metal identification. Designed to be easy to use for people with little technical training they are delivered factory-calibrated for a specific application.
The TRACER 5i family is intended for research. It provides flexibility in measurement conditions, as well as the ability to create and modify calibrations.

www.bruker.com/products/x-ray-diffraction-and-elemen...

Contacts

Address
Bruker Nano GmbH
Oestliche Rheinbrueckenstr. 49
76187 Karlsruhe
Germany

Phone: +49 721 509975950

Anja Griessmeier
Phone: +49 721 509975950
info.bna@bruker.com


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