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SnLayer - Thickness of tin layers

The thickness of the non-alloyed and alloyed tin layer on thin copper wires can be measured with high accuracy in a short duration by this electrochemical analyzer SnLayer.

The coulometric determination of the thickness of the tin layer at the copper wires based on the newly developed multiple potential-ramp procedure.

The total amount of tin as well as the non-alloyed and the alloyed tin-part is detectable in only one measurement.

The SnLayer can be used for determination of thickness of tin at copper wires, strands and conductors in galvanic plating process.

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Exhibitor: ECH Elektrochemie Halle GmbH

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Hermle Labortechnik GmbH
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Ratiolab GmbH
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EMCLAB Instruments GmbH
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2mag AG
Booth number: 506